Work of LIST researchers featured on well-read nanotechnology news portal

Published on 07/10/2015

Researchers from the Advanced Instrumentation for Ion Nano-Analytics (AINA) research group at the Luxembourg Institute of Science and Technology (LIST) were recently invited to publish a review paper in the scientific journal Nanotechnology. As a result, the group, which is developing innovative correlative microscopy instruments and methodologies and is part of LIST’s Materials Research and Technology department, was featured by Nanotechweb.org in their online column Lab Talk last week. With over 45,000 monthly visitors and 24,000 weekly subscribers to their newswire, this will provide high visibility to the researchers’ work within the scientific community.

The paper “High-resolution high-sensitivity elemental imaging by secondary ion mass spectrometry: from traditional 2D and 3D imaging to correlative microscopy”, written by LIST researchers Tom Wirtz, Patrick Philipp, Jean-Nicolas Audinot, David Dowsett and Santhana Eswara, and published in Nanotechnology, Volume 26, Number 43, looks at secondary ion mass spectrometry (SIMS) applied to 2D and 3D elemental imaging and how it can be further improved. In particular, the use of SIMS-based correlative microscopy is investigated in detail.

>> View the article on the Advanced Instrumentation for Ion Nano-Analytics research group

>>Access the abstract of the research paper

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