Correlative microscopy combining transmission electron microscopy and secondary ion mass spectrometry: A general review on the state-of-the-art, recent developments, and prospects

Authors

S. Eswara, A. Pshenova, L. Yedra, Q. H. Hoang, J. Lovric, P. Philipp, and T. Wirtz

Reference

Applied Physics Reviews, vol. 6, no. 2, art. no. 021312, 2019

Link

doi:10.1063/1.5064768

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