Correlative microscopy combining transmission electron microscopy and secondary ion mass spectrometry: A general review on the state-of-the-art, recent developments, and prospects
S. Eswara, A. Pshenova, L. Yedra, Q. H. Hoang, J. Lovric, P. Philipp, and T. Wirtz
Applied Physics Reviews, vol. 6, no. 2, art. no. 021312, 2019