In situ Correlative Helium Ion Microscopy and Secondary Ion Mass Spectrometry for high-resolution nano-analytics in life sciences

Authors

J. Lovric, J.-N. Audinot, and T. Wirtz

Reference

Microscopy and Microanalysis, vol. 25, no. S2, pp. 1026-1027, 2019

Link

doi:10.1017/S1431927619005865

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