In situ Correlative Helium Ion Microscopy and Secondary Ion Mass Spectrometry for high-resolution nano-analytics in life sciences
J. Lovric, J.-N. Audinot, and T. Wirtz
Microscopy and Microanalysis, vol. 25, no. S2, pp. 1026-1027, 2019
doi:10.1017/S1431927619005865