Magnetic Sector SIMS System with Continuous Focal Plane Detector for Advanced Analytical Capabilities on FIB Instruments
Authors
T. Wirtz, O. De Castro, A. Biesemeier, H. Q. Hoang, and J.-N. Audinot
Reference
Microscopy and Microanalysis, doi:10.1017/S1431927620019984, 2020
