Nanoscale correlative imaging of low-Z elements by in-situ Secondary Ion Mass Spectrometry in a Transmission Electron Microscope
S. Eswara, J. Lovric, and T. Wirtz
Microscopy and Microanalysis, vol. 25, no. S2, pp. 1778-1779, 2019
doi:10.1017/S1431927619009620
