Polycrystalline (Sb,Bi)₂Se₃ thin film layers for SWIR detection

Authors

T. Weiss, M. Melchiorre, P. Arnou, N. Valle, P. Dale, and S. Siebentritt

Reference

in Infrared Sensors, Devices, and Applications IX, San Diego, California, United States, 14-15 August 2019, Conference 11129, Session 1: Novel Detector Concepts and Theory, art. no. 11129-3, 2019

Description

Polycrystalline thin films of (Sb_0.42Bi_0.58)₂Se₃ are prepared by co-evaporation in a two-step process. First, the semiconducting layer is grown at 240°C. Subsequently the films are annealed in-situ at various temperatures. The incorporation of Bi into the orthorhombic Sb₂Se₃ system reduces the bandgap and thus widens the range for infrared detection. It is found that thin film layers can be prepared single phase, while a decomposition is observed for temperatures exceeding 440°C, where the rhombohedral structure of Bi₂Se₃ forms in addition. Photoluminescence measurements show an increased optoelectronic quality of the films with increasing annealing temperature. However, the luminescence signal reduces when the films decompose into the orthorhombic and the rhombohedral phases.

Link

doi:10.1117/12.2529326