Stationary beam full-field transmission helium ion microscopy using sub-50 keV He+: Projected images and intensity patterns
Authors
M. Mousley, S. Eswara, O. De Castro, O. Bouton, N. Klingner, C. T. Koch, G. Hlawacek, and T. Wirtz
Reference
Beilstein Journal of Nanotechnology, vol. 10, pp. 1648-1657, 2019
