Advanced Instrumentation for Ion Nano-Analytics

Our research challenges

The "Advanced Instrumentation for Ion Nano-Analytics" research group focuses on the development of scientific instruments based on charged particle beams, covering fundamental investigations, instrument development and applications.

Our competencies

The team comprises specialists in nano-analytics, in charged particle optics, in ion-mater interactions and in engineering (mechanics, electronics, software) giving to the group the complete spectrum and know-how that is required to covert innovative ideas and concepts into prototypes instruments.

Typical applications

  • Correlative microscopy: nanoanalytics combining high-lateral resolution and high-sensitivity chemical analysis
  • Development of high-performance SIMS add-on systems
  • Developement of high performance field portable mass spectrometers
  • Development of ion sources
  • Optimization of sensitivity and quantification in SIMS
  • Investigation of particle -matter interactions

Our equipment

  • Helium Ion Microscope Zeiss ORION Nanofab with SIMS add-on systems (in-house development)
  • Transmission Electron Microscope FEI Tecnai F20 with FIB column and SIMS add-on system (in-house development)
  • Secondary Ion Mass Spectrometer Cameca IMS 4f
  • Secondary Ion Mass Spectrometer CMS (in-house developement)
  • Various test benches for charged particle optics instrumentation
Research domains
  • Materials

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Contact

Dr Tom WIRTZ
Dr Tom WIRTZ
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