A rhombohedral ferroelectric phase in epitaxially strained Hf0.5Zr0.5O2 thin films

Authors

Y. Wei, P. Nukala, M. Salverda, S. Matzen, H. J. Zhao, J. Momand, A. S. Everhardt, G. Agnus, G. R. Blake, P. Lecoeur, B. J. Kooi, J. Íñiguez, B. Dkhil, and B. Noheda

Reference

Nature Materials, vol. 17, no. 12, pp. 1095-1100, 2018

Link

doi:10.1038/s41563-018-0196-0

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