Nanoscale Mass-Spectrometry Imaging of Grain Boundaries in Perovskite Semiconductors

22/10/2020

Authors

O.J. Usiobo, H. Kanda, P. Gratia, I. Zimmermann, T. Wirtz, M.K. Nazeeruddin, and J.N. Audinot

Reference

Journal of Physical Chemistry C, vol. 124, no. 42, pp. 23230-23236, 2020

Description

Incorporation of alkali metals such as Cs+, Rb+, and K+ into hybrid organic-inorganic halide lead perovskites (HOIPs) generally improves the optoelectronic properties of HOIPs. However, it is still uncertain how alkali metals interact and distribute within the HOIPs. There is also a struggle in finding a technique for nanometer-scale structural and chemical characterization without laborious sample preparation or risking severe beam damage of the material during characterization. Here, we have investigated the nanometer-scale distribution of alkali pairs (K-Cs, Rb-Cs, and K-Rb) incorporated into a HOIP using helium-ion microscopy coupled with secondary-ion mass spectrometry (HIM-SIMS) that allows for nanometer-scale elemental and morphological imaging at an unprecedented spatial resolution. HIM-SIMS analysis reveals that Rb segregates at perovskite grain boundaries irrespective of whether it is paired with Cs or K.

Link

doi:10.1021/acs.jpcc.0c07464

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