Secondary ion mass spectrometry in the TEM: Isotope specific high resolution correlative imaging

Authors

L. Yedra, S. Eswara, D. Dowsett, H. Q. Hoang, and T. Wirtz

Reference

Microscopy and Microanalysis, vol. 23, no. S1, pp. 316-317, 2017

Link

doi:10.1017/S1431927617002264