Investigating the Electromechanical Behavior of Unconventionally Ferroelectric Hf0.5Zr0.5O2-Based Capacitors Through Operando Nanobeam X-Ray Diffraction
Authors :
Stylianidis E., Surabhi P., Hamming-Green R., Salverda M., Wei Y., Burema A., Matzen S., Banerjee T., Björling A., Mukherjee B., Dutta S., Aramberri H., Íñiguez J., Noheda B., Carbone D., Nukala P.
Reference :
Advanced Electronic Materials, vol. 9, n° 6, art. no. 2201298, 2023
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