The scientific publications of CRPs Henri Tudor and Gabriel Lippmann published before the creation of LIST are available online: download CRP Henri Tudor's PDF (910KB) and CRP - Gabriel Lippmann's PDF (1,3KB).
Strain-induced deformation mechanisms of polylactide plasticized with acrylated poly(ethylene glycol) obtained by reactive extrusion
Authors : K. Wang, B. Brüster, F. Addiego, G. Kfoury, F. Hassouna, D. Ruch, J. M. Raquez, and P. Dubois Reference : Polymer International, vol. 64, no. 11, pp. 1544-1554, 2015
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Multiple bifurcations in wrinkling analysis of thin films on compliant substrates
Authors : F. Xu, M. Potier-Ferry, S. Belouettar, and H. Hu Reference : International Journal of Non-Linear Mechanics, vol. 76, pp. 203-222, 2015
Thermo-anisotropic crack propagation by XFEM
Authors : L. Bouhala, A. Makradi, and S. Belouettar Reference : International Journal of Mechanical Sciences, vol. 103, pp. 235-246, 2015
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Investigation of the depth-profiling capabilities of the Storing Matter technique
Authors : B. Kasel and T. Wirtz Reference : Journal of Mass Spectrometry, vol. 50, no. 10, pp. 1144-1149, 2015
Unraveling the architecture of plasma polymers by electrospray tandem mass spectrometry
Authors : T. Fouquet Reference : International Journal of Mass Spectrometry, vol. 389, pp. 1-9, 2015
High-resolution high-sensitivity elemental imaging by secondary ion mass spectrometry: from traditional 2D and 3D imaging to correlative microscopy
Authors : T. Wirtz, P. Philipp, J. N. Audinot, D. Dowsett, and S. Eswara Reference : Nanotechnology, vol. 26, no. 43, art. no. 434001, 2015
Time-resolved small-angle X-ray scattering study of void fraction evolution in high-density polyethylene during stress unloading and strain recovery
Authors : F. Addiego, S. Patlazhan, K. Wang, S. André, S. Bernstorff, and D. Ruch Reference : Polymer International, vol. 64, no. 11, pp. 1513-1521, 2015
Advanced SIMION techniques: Boundary matching and genetic optimization
Authors : D. Dowsett Reference : Microscopy and Microanalysis, vol. 21, no. S4, pp. 218-223, 2015
Silver diffusion in organic optoelectronic devices: Deposition-related processes versus Secondary Ion Mass Spectrometry analysis artifacts
Authors : P. Philipp, K. Q. Ngo, J. Kieffer, and T. Wirtz Reference : The Journal of Physical Chemistry C, vol. 119, no. 41, pp. 23334-23341, 2015
Significant enhancement of negative secondary ion yields by cluster ion bombardment combined with cesium flooding
Authors : P. Philipp, T. B. Angerer, S. Sämfors, P. Blenkinsopp, J. S. Fletcher, and T. Wirtz Reference : Analytical Chemistry, Vol. 87, no. 19, pp. 10025–10032, 2015
Higher-order hierarchical models for the free vibration analysis of thin-walled beams
Authors : G. Giunta, and S. Belouettar Reference : Mathematical Problems in Engineering, vol. 2015, Art. ID 940347, 12 p., 2015