149 results:

71. Evaluation of secondary electron intensities for dopant profiling in ion implanted semiconductors: A correlative study combining SE, SIMS and ECV methods
Date: 04-12-23  Score: 1,72  Percental score: 49 

… Tabean S., Morisset A., Wyss P., Lehmann M., Haug F.J., Jeangros Q., Hessler-Wyser A., Valle N., Wirtz T., Eswara S.

72. Intrinsic halide segregation at nanometer scale determines the high efficiency of mixed cation/mixed halide perovskite solar cells
Date: 05-12-16  Score: 1,65  Percental score: 47 

… E. Mosconi, I. Zimmermann, D. Dowsett, Y. Lee, M. Grätzel, F. De Angelis, K. Sivula, T. Wirtz, and M. K. Nazeeruddin

73. Synthesis of novel benzoxazines containing sulfur and their application in rubber compounds
Date: 28-12-23  Score: 1,65  Percental score: 47 

… vol. 13, n° 8, art. no. 1262, 2021 Trejo-Machin A., Cosas Fernandes J.P., Puchot L., Balko S., Wirtz M., Weydert M., Verge P.

74. Synthesis and magnetic properties of Ta/NdFeB-based composite microwires
Date: 05-06-15  Score: 1,64  Percental score: 47 

… Physics, vol. 117, no. 17, art. no. 17D134, 2015 P. Szary, I. Luciu, D. Duday, E. A. Périgo, T. Wirtz, P. Choquet, and A. Michels

75. Correlative high-resolution imaging of hydrogen in Mg2Ni hydrogen storage thin films
Date: 04-12-23  Score: 1,64  Percental score: 47 

… vol. 48, n° 37, pp. 13943-13954, 2023 Andersen D., Chen H., Pal S., Cressa L., De Castro O., Wirtz T., Schmitz G., Eswara S.

76. Quantification of hydrogen in nanostructured hydrogenated passivating contacts for silicon photovoltaics combining SIMS-APT-TEM: A multiscale correlative approach
Date: 04-12-23  Score: 1,63  Percental score: 47 

… J., Lehmann M., Jeangros Q., Valle N., Haug F.J., Hessler-Wyser A., Shyam Kumar C.N., Mücklich F., Wirtz T., Eswara S.

77. Lift-Out Specimen Preparation and Multiscale Correlative Investigation of Li-Ion Battery Electrodes Using Focused Ion Beam-Secondary Ion Mass Spectrometry Platforms
Date: 22-10-24  Score: 1,62  Percental score: 47 

… 42, pp. 57141-57150, 2024 Delfino P.M., Bofanova M., De Vito E., Dupré N., Lamblin G., Porcher W., Wirtz T., Audinot J.N.

78. Highest resolution chemical imaging based on secondary ion mass spectrometry performed on the helium ion microscope
Date: 04-12-23  Score: 1,62  Percental score: 46 

… 84, n° 10, art. no. 105901, 2021 Audinot J.N., Philipp P., De Castro O., Biesemeier A., Hoang Q.H., Wirtz T.

79. LIST launches its award-winning nano-imaging instrument in the market and signs licensing agreement with German manufacturer Raith
Date: 22-02-24  Score: 1,62  Percental score: 46 

The technology that has been a decade in the making will now be available for broader distribution.

80. An in situ correlative STEM-EDS and HRTEM based nanoscale chemical characterization of solid–liquid interfaces in an aluminium alloy
Date: 17-05-16  Score: 1,60  Percental score: 46 

… widths. Journal of Microscopy, vol. 264, no. 1, pp. 94-70, 2016 S. Eswara, C. Mitterbauer, T. Wirtz, S. Kujawa, and J. M. Howe