149 results:

21. Cross-sectional characterization of the conversion layer formed on AA2024-T3 by a lithium-leaching coating
Date: 11-02-20  Score: 3,11  Percental score: 89 

… vol. 512, art. no. 145665, 2020 A. Kosari, P. Visser, F. Tichelaar, S. Eswara, J. N. Audinot, T. Wirtz, H. Zandbergen, H. Terryn, and J. M. C. Mol

22. Structural and chemical evolution of Au-silica core–shell nanoparticles during 20 keV helium ion irradiation: a comparison between experiment and simulation
Date: 24-07-20  Score: 3,11  Percental score: 89 

… Scientific Reports, vol. 10, no. 1, art. no. 12058, 2020 M. Mousley, W. Möller, P. Philipp, G. Hlawacek, T. Wirtz, and S. Eswara

23. In situ Correlative Helium Ion Microscopy and Secondary Ion Mass Spectrometry for high-resolution nano-analytics in life sciences
Date: 16-08-19  Score: 3,09  Percental score: 89 

… Microscopy and Microanalysis, vol. 25, no. S2, pp. 1026-1027, 2019 J. Lovric, J.-N. Audinot, and T. Wirtz

24. In situ correlative microscopy combining transmission electron microscopy and secondary ion mass spectrometry
Date: 04-09-18  Score: 3,07  Percental score: 88 

… S1, pp. 380-381, 2018 S. Eswara, L. Yedra, A. Pshenova, V. Sarbada, J.-N. Audinot, R. Hull, and T. Wirtz

25. Light stability enhancement of perovskite solar cells using 1H,1H,2H,2H-perfluorooctyltriethoxysilane passivation
Date: 14-12-20  Score: 3,06  Percental score: 88 

… O. J. Usiobo, C. Momblona, M. Abuhelaiqa, A. A. Sutanto, C. Igci, X.-X. Gao, J.-N. Audinot, T. Wirtz, and M. K. Nazeeruddin

26. Stationary beam full-field transmission helium ion microscopy using sub-50 keV He+: Projected images and intensity patterns
Date: 12-08-19  Score: 3,05  Percental score: 87 

… 2019 M. Mousley, S. Eswara, O. De Castro, O. Bouton, N. Klingner, C. T. Koch, G. Hlawacek, and T. Wirtz

27. Scanning transmission imaging in the helium ion microscope using a microchannel plate with a delay line detector
Date: 28-12-20  Score: 3,05  Percental score: 87 

… 1854-1864, 2020 E. Serralta, N. Klingner, O. De Castro, M. Mousley, S. Eswara, S. Duarte Pinto, T. Wirtz, and G. Hlawacek

28. Parallel ion electron spectrometry (PIES): A new paradigm for high-resolution high-sensitivity characterization based on integrated TEM-SIMS
Date: 12-12-16  Score: 3,04  Percental score: 87 

…y and Microanalysis, vol. 21, no. S3, pp. 1859-1860, Aug.2015 S. Eswara Moorthy, D. Dowsett, L. Yedra, and T. Wirtz

29. The IONMASTER magSIMS: An Innovative Multi-ion Species FIB Platform for Correlative High-resolution Ion Microscopy and SIMS Analyses
Date: 28-01-25  Score: 3,00  Percental score: 86 

… vol. 30, n° 2024, pp. 510-511, 2024 Ost A.D., Richter T., De Castro O., Gnauck P., Audinot J.N., Wirtz T.

30. A method for quantitative nanoscale imaging of dopant distributions using secondary ion mass spectrometry: an application example in silicon photovoltaics
Date: 02-09-19  Score: 3,00  Percental score: 86 

… M. Lehmann, A. Ingenito, Q. Jeangros, F.-J. Haug, N. Valle, P. Philipp, A. Hessler-Wyser, and T. Wirtz