149 results:

81. Scanning-Assisted Focal Plane-Detection System for a sector-field mass spectrometer - Part-II: Experimental findings
Date: 20-09-24  Score: 1,59  Percental score: 46 

… Detectors and Associated Equipment, vol. 1069, art. no. 169842, 2024 Pureti R., Bouton O., Wirtz T., Hoang H.Q.

82. Nanoscale Surface Analysis Reveals Origins of Enhanced Interface Passivation in RbF Post Deposition Treated CIGSe Solar Cells
Date: 04-12-23  Score: 1,58  Percental score: 45 

… 30, art. no. 2300590, 2023 Boumenou C.K., Phirke H., Rommelfangen J., Audinot J.N., Nishiwaki S., Wirtz T., Carron R., Redinger A.

83. When subcellular chemical imaging enlightens our understanding on intestinal absorption, intracellular fate and toxicity of PFOA in vitro
Date: 30-10-24  Score: 1,57  Percental score: 45 

… Cambier S., Subirana M.A., Schaumlöffel D., Gomez G., Pittois D., Guignard C., Schwamborn J.C., Wirtz T., Gutleb A.C., Mercier-Bonin M., Audinot J.N.

84. 4D Surface Reconstructions to Study Microscale Structures and Functions in Soil Biogeochemistry
Date: 04-12-23  Score: 1,57  Percental score: 45 

… and Technology, vol. 55, n° 13, pp. 9384-9393, 2021 Ost A.D., Wu T., Höschen C., Mueller C.W., Wirtz T., Audinot J.N.

85. Experimental and simulation-based investigation of He, Ne and Ar irradiation of polymers for ion microscopy
Date: 04-08-16  Score: 1,56  Percental score: 45 

… HIM. Beilstein Journal of Nanotechnology, vol. 7, pp. 1113-1128, 2016 L. Rzeznik, Y. Fleming, T. Wirtz, and P. Philipp

86. Work of LIST researchers featured on well-read nanotechnology news portal
Date: 03-11-15  Score: 1,54  Percental score: 44 

Work by researchers in the Advanced Instrumentation for Ion Nano-Analytics (AINA) group was featured on a popular nanotechnology blog

87. Microscopy research ‘made in Luxembourg’ receives Innovation award from international publication
Date: 29-10-20  Score: 1,54  Percental score: 44 

Innovation Award 2020 from international publication Microscopy Today

88. Understanding and decoupling the role of wavelength and defects in light-induced degradation of metal-halide perovskites
Date: 13-12-23  Score: 1,53  Percental score: 44 

… Krishna A., Boziki A., Audinot J.N., Farooq M.U., Machado J.F., Mladenović M., Phirke H., Singh A., Wirtz T., Tkatchenko A., Graetzel M., Hagfeldt A., Redinger A.

89. Silver diffusion in organic optoelectronic devices: Deposition-related processes versus Secondary Ion Mass Spectrometry analysis artifacts
Date: 15-10-15  Score: 1,53  Percental score: 44 

… Chemistry C, vol. 119, no. 41, pp. 23334-23341, 2015 P. Philipp, K. Q. Ngo, J. Kieffer, and T. Wirtz

90. Magnetic Sector Secondary Ion Mass Spectrometry on FIB-SEM Instruments for Nanoscale Chemical Imaging
Date: 04-12-23  Score: 1,53  Percental score: 44 

… Hoang H.Q., Coulbary C., Bouton O., Barrahma R., Ost A., Stoffels C., Jiao C., Dutka M., Geryk M., Wirtz T.