149 results:

11. Image fusion in SIMS-based correlative microscopy: Methodology and applications
Date: 21-08-18  Score: 3,22  Percental score: 92 

…croscopy and Microanalysis, vol. 24, no. S1, pp. 404-405, 2018 J.-N. Audinot, F. Vollnhals, S. Eswara, and T. Wirtz

12. Nanoscale correlative imaging of low-Z elements by in-situ Secondary Ion Mass Spectrometry in a Transmission Electron Microscope
Date: 12-08-19  Score: 3,22  Percental score: 92 

… Microscopy and Microanalysis, vol. 25, no. S2, pp. 1778-1779, 2019 S. Eswara, J. Lovric, and T. Wirtz

13. Defect formation in multiwalled carbon nanotubes under low-energy He and Ne ion irradiation
Date: 21-08-18  Score: 3,22  Percental score: 92 

…n Journal of Nanotechnology, vol. 9, pp. 1951-1963, 2018 S. Eswara, J.-N. Audinot, B. El Adib, M. Guennou, T. Wirtz, and P. Philipp

14. Defect formation in multiwalled carbon nanotubes under low-energy He and Ne ion irradiation
Date: 23-07-18  Score: 3,22  Percental score: 92 

…n Journal of Nanotechnology, vol. 9, pp. 1951-1963, 2018 S. Eswara, J. N. Audinot, B. El Adib, M. Guennou, T. Wirtz, and P. Philipp

15. Secondary ion mass spectrometry on the helium ion microscope: methodologies for analysis of nanomaterials
Date: 04-09-18  Score: 3,22  Percental score: 92 

… no. S1, pp. 1016-1017, 2018 J.-N. Audinot, F. Vollnhals, P. Gratia, S. Eswara, P. Philipp, and T. Wirtz

16. The use of Nafion membranes to measure 2H/1H and 18O/16O isotopic ratios in water
Date: 08-11-18  Score: 3,22  Percental score: 92 

… Science, vol. 572, pp. 128-139, 2019 V. López Días, H. Q. Hoang, N. Martínez-Carreras, F. Barnich, T. Wirtz, J. J. McDonnell, and L. Pfister

17. Characterization of materials for energy storage and production by Helium Ion Microscopy coupled to Secondary Ion Mass Spectrometry
Date: 16-08-19  Score: 3,18  Percental score: 91 

… Microscopy and Microanalysis, vol. 25, no. S2, pp. 888-889, 2019 J.-N. Audinot, J. Lovric, and T. Wirtz

18. Magnetic Sector SIMS Systems for FIB Platforms: New Developments, Applications, and Prospects
Date: 28-01-25  Score: 3,16  Percental score: 91 

… Microscopy and Microanalysis, vol. 30, n° 2024, pp. 508-509, 2024 Wirtz T., De Castro O., Hoang H.Q., Biesemeier A., Eswara S., Audinot J.N.

19. Magnetic Sector SIMS System with Continuous Focal Plane Detector for Advanced Analytical Capabilities on FIB Instruments
Date: 16-10-20  Score: 3,14  Percental score: 90 

… Microscopy and Microanalysis, doi:10.1017/S1431927620019984, 2020 T. Wirtz, O. De Castro, A. Biesemeier, H. Q. Hoang, and J.-N. Audinot

20. Integrated SIMS-AFM instrument for accurate high-sensitivity and high-resolution chemical 3D analysis
Date: 12-12-16  Score: 3,13  Percental score: 90 

… Microscopy and Microanalysis, vol. 21, no. S3, pp. 1437-1438, 2015 Y. Fleming, T. Wirtz, and S. Eswara Moorthy