Development of high-performance SIMS add-on systems
We develop compact SIMS add-on systems, which can be mounted on various instruments, including helium ion microscopes (HIM), FIB (focused ion
SIMS system for the Helium Ion Microscope
Secondary Ion Mass Spectrometry (SIMS) is an extremely powerful technique for analyzing surfaces owing in particular to its excellent sensitivity, high
Co-registration and image fusion for correlative microscopy
To correlate the nanoscale details in structural images with the relatively lower resolution SIMS images, the two datasets need to
Optimization of sensitivity and quantification in SIMS
Secondary Ion Mass Spectrometry (SIMS) is a well-established and extremely powerful technique for the chemical analysis of surfaces and thin