SIMS system for the Helium Ion Microscope
Secondary Ion Mass Spectrometry (SIMS) is an extremely powerful technique for analyzing surfaces owing in particular to its excellent sensitivity, high
Context
With the use of peer-to-peer file sharing networks like BitTorrent or Freenet, the distribution of files amongst participants has become fast and easy. In a collaborative environment, this
Optimization of sensitivity and quantification in SIMS
Secondary Ion Mass Spectrometry (SIMS) is a well-established and extremely powerful technique for the chemical analysis of surfaces and thin
Development of high-performance SIMS add-on systems
We develop compact SIMS add-on systems, which can be mounted on various instruments, including helium ion microscopes (HIM), FIB (focused ion