Scanning transmission imaging in the helium ion microscope using a microchannel plate with a delay line detector
Auteurs
E. Serralta, N. Klingner, O. De Castro, M. Mousley, S. Eswara, S. Duarte Pinto, T. Wirtz, and G. Hlawacek
Référence
Beilstein Journal of Nanotechnology, vol. 11, pp. 1854-1864, 2020
