Secondary ion mass spectrometry in the TEM: Isotope specific high resolution correlative imaging
L. Yedra, S. Eswara, D. Dowsett, H. Q. Hoang, and T. Wirtz
Microscopy and Microanalysis, vol. 23, no. S1, pp. 316-317, 2017
doi:10.1017/S1431927617002264
