Tuneable interplay between atomistic defects morphology and electrical properties of transparent p-type highly conductive off-stoichiometric Cu-Cr-O delafossite thin films

29/01/2020

Auteurs

P. Lunca-Popa, J. Botsoa, M. Bahri, J. Crêpellière, P. Desgardin, J.-N. Audinot, T. Wirtz, D. Arl, O. Ersen, M.-F. Barthe, and D. Lenoble

Référence

Scientific Reports, vol. 10, no. 1, art. no. 1416, 2020

Lien

doi:10.1038/s41598-020-58312-z

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