A rhombohedral ferroelectric phase in epitaxially strained Hf0.5Zr0.5O2 thin films
Auteurs
Y. Wei, P. Nukala, M. Salverda, S. Matzen, H. J. Zhao, J. Momand, A. S. Everhardt, G. Agnus, G. R. Blake, P. Lecoeur, B. J. Kooi, J. Íñiguez, B. Dkhil, and B. Noheda
Référence
Nature Materials, vol. 17, no. 12, pp. 1095-1100, 2018
