Magnetic Sector SIMS System with Continuous Focal Plane Detector for Advanced Analytical Capabilities on FIB Instruments

Auteurs

T. Wirtz, O. De Castro, A. Biesemeier, H. Q. Hoang, and J.-N. Audinot

Référence

Microscopy and Microanalysis, doi:10.1017/S1431927620019984, 2020

Lien

doi:10.1017/S1431927620019984

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