Stationary beam full-field transmission helium ion microscopy using sub-50 keV He+: Projected images and intensity patterns
Auteurs
M. Mousley, S. Eswara, O. De Castro, O. Bouton, N. Klingner, C. T. Koch, G. Hlawacek, and T. Wirtz
Référence
Beilstein Journal of Nanotechnology, vol. 10, pp. 1648-1657, 2019
