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101 results:

Nanoanalytics for materials science
Date: 18-11-16  Score: 3,49  Percental score: 100 

… Beilstein Journal of Nanotechnology, vol. 7, pp. 1674-1675, 2016 T. Glatzel and T. Wirtz

HIM-SIMS: Correlative SE/Chemical Imaging at the Limits of Resolution
Date: 21-08-17  Score: 3,45  Percental score: 99 

… Microscopy and Microanalysis, vol. 23, no. S1, pp. 278-279, 2017 D. Dowsett, T. Wirtz, and L. Yedra

Imaging and analytics on the helium ion microscope
Date: 04-02-19  Score: 3,42  Percental score: 98 

… Annual Review of Analytical Chemistry, vol. 12, no. 1, 2019 T. Wirtz, O. D. Castro, J.-N. Audinot, and P. Philipp

Imaging and analytics on the helium ion microscope
Date: 04-02-19  Score: 3,42  Percental score: 98 

… Annual Review of Analytical Chemistry, vol. 12, no. 1, 2019 T. Wirtz, O. D. Castro, J.-N. Audinot, and P. Philipp

Distinguishing Isotopes in the Electron Microscope: In-situ TEM-SIMS Correlative Analysis
Date: 12-12-16  Score: 3,35  Percental score: 96 

… Microscopy and Microanalysis, vol. 22, no. S3, pp. 222-223, 2016 L. Yedra, S. Eswara, D. Dowsett, and T. Wirtz

Towards a high-brightness electron impact ion source for nano-applications
Date: 21-11-16  Score: 3,35  Percental score: 96 

… Microscopy and Microanalysis, vol. 21, no. S4, pp. 94-99, 2015 O. De Castro, D. Dowsett, T. Wirtz, and S. Della Negra

Optical control of polarization in ferroelectric heterostructures
Date: 31-08-18  Score: 3,35  Percental score: 96 

…Nature Communications, vol. 9, no. 1, p. 3344, 2018 T. Li, A. Lipatov, H. Lu, H. Lee, J.-W. Lee, E. Torun, L. Wirtz, C.-B. Eom, J. Íñiguez, A. Sinitskii, and A. Gruverman

Advanced analytical capabilities on FIB instruments using SIMS
Date: 03-08-20  Score: 3,35  Percental score: 96 

… Microscopy and Microanalysis, doi:10.1017/S143192762001332X, 2020 T. Wirtz, O. De Castro, A. Biesemeier, H. Q. Hoang, and J.-N. Audinot

Materials science in Luxembourg
Date: 30-07-15  Score: 3,31  Percental score: 95 

… Nature Materials, vol. 13, no. 3, pp. 219-222, 2014 J. Kreisel, L. Wirtz, and M. Schiltz

Secondary ion mass spectrometry in the TEM: Isotope specific high resolution correlative imaging
Date: 21-08-17  Score: 3,29  Percental score: 94 

…py and Microanalysis, vol. 23, no. S1, pp. 316-317, 2017 L. Yedra, S. Eswara, D. Dowsett, H. Q. Hoang, and T. Wirtz