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101 results:

Cross-sectional characterization of the conversion layer formed on AA2024-T3 by a lithium-leaching coating
Date: 11-02-20  Score: 3,11  Percental score: 89 

… vol. 512, art. no. 145665, 2020 A. Kosari, P. Visser, F. Tichelaar, S. Eswara, J. N. Audinot, T. Wirtz, H. Zandbergen, H. Terryn, and J. M. C. Mol

Structural and chemical evolution of Au-silica core–shell nanoparticles during 20 keV helium ion irradiation: a comparison between experiment and simulation
Date: 24-07-20  Score: 3,11  Percental score: 89 

… Scientific Reports, vol. 10, no. 1, art. no. 12058, 2020 M. Mousley, W. Möller, P. Philipp, G. Hlawacek, T. Wirtz, and S. Eswara

In situ Correlative Helium Ion Microscopy and Secondary Ion Mass Spectrometry for high-resolution nano-analytics in life sciences
Date: 16-08-19  Score: 3,09  Percental score: 89 

… Microscopy and Microanalysis, vol. 25, no. S2, pp. 1026-1027, 2019 J. Lovric, J.-N. Audinot, and T. Wirtz

In situ correlative microscopy combining transmission electron microscopy and secondary ion mass spectrometry
Date: 04-09-18  Score: 3,07  Percental score: 88 

… S1, pp. 380-381, 2018 S. Eswara, L. Yedra, A. Pshenova, V. Sarbada, J.-N. Audinot, R. Hull, and T. Wirtz

Light stability enhancement of perovskite solar cells using 1H,1H,2H,2H-perfluorooctyltriethoxysilane passivation
Date: 14-12-20  Score: 3,06  Percental score: 88 

… O. J. Usiobo, C. Momblona, M. Abuhelaiqa, A. A. Sutanto, C. Igci, X.-X. Gao, J.-N. Audinot, T. Wirtz, and M. K. Nazeeruddin

Stationary beam full-field transmission helium ion microscopy using sub-50 keV He+: Projected images and intensity patterns
Date: 12-08-19  Score: 3,05  Percental score: 87 

… 2019 M. Mousley, S. Eswara, O. De Castro, O. Bouton, N. Klingner, C. T. Koch, G. Hlawacek, and T. Wirtz

Scanning transmission imaging in the helium ion microscope using a microchannel plate with a delay line detector
Date: 28-12-20  Score: 3,05  Percental score: 87 

… 1854-1864, 2020 E. Serralta, N. Klingner, O. De Castro, M. Mousley, S. Eswara, S. Duarte Pinto, T. Wirtz, and G. Hlawacek

Parallel ion electron spectrometry (PIES): A new paradigm for high-resolution high-sensitivity characterization based on integrated TEM-SIMS
Date: 12-12-16  Score: 3,04  Percental score: 87 

…y and Microanalysis, vol. 21, no. S3, pp. 1859-1860, Aug.2015 S. Eswara Moorthy, D. Dowsett, L. Yedra, and T. Wirtz

A method for quantitative nanoscale imaging of dopant distributions using secondary ion mass spectrometry: an application example in silicon photovoltaics
Date: 02-09-19  Score: 3,00  Percental score: 86 

… M. Lehmann, A. Ingenito, Q. Jeangros, F.-J. Haug, N. Valle, P. Philipp, A. Hessler-Wyser, and T. Wirtz

Synthesis, theoretical and experimental characterisation of thin film Cu2Sn1-xGexS3 ternary alloys (x=0 to 1): Homogeneous intermixing of k for Sn and Ge
Date: 12-06-18  Score: 3,00  Percental score: 86 

… J. de Wild, C. Spindler, F. Babbe, H. Elanzeery, B. El Adib, R. Treharne, H. P. C. Miranda, L. Wirtz, S. Schorr, and P. J. Dale