Secondary ion mass spectrometry

Authors

L. Sangely, B. Boyer, E. De Chambost, N. Valle, J.-N. Audinot, T. Ireland, M. Wiedenbeck, J. Aléon, H. Jungnickel, J.-P. Barnes, P. Bienvenu, and U. Breuer

Reference

New Developments in Mass Spectrometry, vol. 2015-January, no. 3, pp. 439-499, 2015

Link

doi : 10.1039/2045-7553

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